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Gate dielectrics and mos ulsis: principles, technologies and applications
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Springer
1997
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-60856-8 http://cds.cern.ch/record/1628391 |
| _version_ | 1780933986060599296 |
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| author | Hori, Takashi |
| author_facet | Hori, Takashi |
| author_sort | Hori, Takashi |
| collection | CERN |
| id | cern-1628391 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16283912021-04-21T21:36:05Zdoi:10.1007/978-3-642-60856-8http://cds.cern.ch/record/1628391engHori, TakashiGate dielectrics and mos ulsis: principles, technologies and applicationsGeneral Theoretical PhysicsSpringeroai:cds.cern.ch:16283911997 |
| spellingShingle | General Theoretical Physics Hori, Takashi Gate dielectrics and mos ulsis: principles, technologies and applications |
| title | Gate dielectrics and mos ulsis: principles, technologies and applications |
| title_full | Gate dielectrics and mos ulsis: principles, technologies and applications |
| title_fullStr | Gate dielectrics and mos ulsis: principles, technologies and applications |
| title_full_unstemmed | Gate dielectrics and mos ulsis: principles, technologies and applications |
| title_short | Gate dielectrics and mos ulsis: principles, technologies and applications |
| title_sort | gate dielectrics and mos ulsis: principles, technologies and applications |
| topic | General Theoretical Physics |
| url | https://dx.doi.org/10.1007/978-3-642-60856-8 http://cds.cern.ch/record/1628391 |
| work_keys_str_mv | AT horitakashi gatedielectricsandmosulsisprinciplestechnologiesandapplications |