NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy

Detalles Bibliográficos
Autor principal: Cherns, David
Lenguaje:eng
Publicado: Springer 1990
Materias:
Other Fields of Physics
Acceso en línea:https://dx.doi.org/10.1007/978-1-4613-0527-9
http://cds.cern.ch/record/1630594
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author Cherns, David
author_facet Cherns, David
author_sort Cherns, David
collection CERN
id cern-1630594
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1990
publisher Springer
record_format invenio
spelling cern-16305942021-04-25T16:51:40Zdoi:10.1007/978-1-4613-0527-9http://cds.cern.ch/record/1630594engCherns, DavidNATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron MicroscopyOther Fields of PhysicsSpringeroai:cds.cern.ch:16305941990
spellingShingle Other Fields of Physics
Cherns, David
NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title_full NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title_fullStr NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title_full_unstemmed NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title_short NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy
title_sort nato advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy
topic Other Fields of Physics
url https://dx.doi.org/10.1007/978-1-4613-0527-9
http://cds.cern.ch/record/1630594
work_keys_str_mv AT chernsdavid natoadvancedresearchworkshopontheevaluationofadvancedsemiconductormaterialsbyelectronmicroscopy

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