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Ellipsometry of functional organic surfaces and films
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surface...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2013
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| Acceso en línea: | http://cds.cern.ch/record/1634074 |
| _version_ | 1780934439698694144 |
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| author | Hinrichs, Karsten Eichhorn, Klaus-Jochen |
| author_facet | Hinrichs, Karsten Eichhorn, Klaus-Jochen |
| author_sort | Hinrichs, Karsten |
| collection | CERN |
| description | Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. |
| id | cern-1634074 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2013 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16340742021-04-21T21:31:45Zhttp://cds.cern.ch/record/1634074engHinrichs, KarstenEichhorn, Klaus-JochenEllipsometry of functional organic surfaces and filmsEngineeringEllipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.Springeroai:cds.cern.ch:16340742013 |
| spellingShingle | Engineering Hinrichs, Karsten Eichhorn, Klaus-Jochen Ellipsometry of functional organic surfaces and films |
| title | Ellipsometry of functional organic surfaces and films |
| title_full | Ellipsometry of functional organic surfaces and films |
| title_fullStr | Ellipsometry of functional organic surfaces and films |
| title_full_unstemmed | Ellipsometry of functional organic surfaces and films |
| title_short | Ellipsometry of functional organic surfaces and films |
| title_sort | ellipsometry of functional organic surfaces and films |
| topic | Engineering |
| url | http://cds.cern.ch/record/1634074 |
| work_keys_str_mv | AT hinrichskarsten ellipsometryoffunctionalorganicsurfacesandfilms AT eichhornklausjochen ellipsometryoffunctionalorganicsurfacesandfilms |