Cargando…
Ellipsometry of functional organic surfaces and films
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surface...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2013
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1634074 |