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Ellipsometry of functional organic surfaces and films
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surface...
Autores principales: | Hinrichs, Karsten, Eichhorn, Klaus-Jochen |
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Lenguaje: | eng |
Publicado: |
Springer
2013
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1634074 |
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