Cargando…
High-resolution electron microscopy
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Oxford Univ. Press
2013
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1093/acprof:oso/9780199668632.001.0001 http://cds.cern.ch/record/1638763 |