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Frontiers in optical methods: nano-characterization and coherent control
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement techno...
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
Springer
2014
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-40594-5 http://cds.cern.ch/record/1642279 |
_version_ | 1780934936434311168 |
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author | Shudo, Ken-ichi Katayama, Ikufumui Ohno, Shin-Ya |
author_facet | Shudo, Ken-ichi Katayama, Ikufumui Ohno, Shin-Ya |
author_sort | Shudo, Ken-ichi |
collection | CERN |
description | This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan. |
id | cern-1642279 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2014 |
publisher | Springer |
record_format | invenio |
spelling | cern-16422792021-04-21T21:22:38Zdoi:10.1007/978-3-642-40594-5http://cds.cern.ch/record/1642279engShudo, Ken-ichiKatayama, IkufumuiOhno, Shin-YaFrontiers in optical methods: nano-characterization and coherent controlOther Fields of PhysicsThis collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.Springeroai:cds.cern.ch:16422792014 |
spellingShingle | Other Fields of Physics Shudo, Ken-ichi Katayama, Ikufumui Ohno, Shin-Ya Frontiers in optical methods: nano-characterization and coherent control |
title | Frontiers in optical methods: nano-characterization and coherent control |
title_full | Frontiers in optical methods: nano-characterization and coherent control |
title_fullStr | Frontiers in optical methods: nano-characterization and coherent control |
title_full_unstemmed | Frontiers in optical methods: nano-characterization and coherent control |
title_short | Frontiers in optical methods: nano-characterization and coherent control |
title_sort | frontiers in optical methods: nano-characterization and coherent control |
topic | Other Fields of Physics |
url | https://dx.doi.org/10.1007/978-3-642-40594-5 http://cds.cern.ch/record/1642279 |
work_keys_str_mv | AT shudokenichi frontiersinopticalmethodsnanocharacterizationandcoherentcontrol AT katayamaikufumui frontiersinopticalmethodsnanocharacterizationandcoherentcontrol AT ohnoshinya frontiersinopticalmethodsnanocharacterizationandcoherentcontrol |