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Transmission electron microscopy: physics of image formation and microanalysis

The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and ph...

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Detalles Bibliográficos
Autor principal: Reimer, Ludwig
Lenguaje:eng
Publicado: Springer 1989
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-662-21579-1
http://cds.cern.ch/record/1663792
_version_ 1780935240652423168
author Reimer, Ludwig
author_facet Reimer, Ludwig
author_sort Reimer, Ludwig
collection CERN
description The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy
id cern-1663792
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1989
publisher Springer
record_format invenio
spelling cern-16637922021-04-21T21:19:05Zdoi:10.1007/978-3-662-21579-1http://cds.cern.ch/record/1663792engReimer, LudwigTransmission electron microscopy: physics of image formation and microanalysisGeneral Theoretical PhysicsThe aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopySpringeroai:cds.cern.ch:16637921989
spellingShingle General Theoretical Physics
Reimer, Ludwig
Transmission electron microscopy: physics of image formation and microanalysis
title Transmission electron microscopy: physics of image formation and microanalysis
title_full Transmission electron microscopy: physics of image formation and microanalysis
title_fullStr Transmission electron microscopy: physics of image formation and microanalysis
title_full_unstemmed Transmission electron microscopy: physics of image formation and microanalysis
title_short Transmission electron microscopy: physics of image formation and microanalysis
title_sort transmission electron microscopy: physics of image formation and microanalysis
topic General Theoretical Physics
url https://dx.doi.org/10.1007/978-3-662-21579-1
http://cds.cern.ch/record/1663792
work_keys_str_mv AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis