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Transmission electron microscopy: physics of image formation and microanalysis
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and ph...
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Lenguaje: | eng |
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Springer
1989
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Acceso en línea: | https://dx.doi.org/10.1007/978-3-662-21579-1 http://cds.cern.ch/record/1663792 |
_version_ | 1780935240652423168 |
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author | Reimer, Ludwig |
author_facet | Reimer, Ludwig |
author_sort | Reimer, Ludwig |
collection | CERN |
description | The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy |
id | cern-1663792 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1989 |
publisher | Springer |
record_format | invenio |
spelling | cern-16637922021-04-21T21:19:05Zdoi:10.1007/978-3-662-21579-1http://cds.cern.ch/record/1663792engReimer, LudwigTransmission electron microscopy: physics of image formation and microanalysisGeneral Theoretical PhysicsThe aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy The principles of particle and wave optics of electrons are described Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopySpringeroai:cds.cern.ch:16637921989 |
spellingShingle | General Theoretical Physics Reimer, Ludwig Transmission electron microscopy: physics of image formation and microanalysis |
title | Transmission electron microscopy: physics of image formation and microanalysis |
title_full | Transmission electron microscopy: physics of image formation and microanalysis |
title_fullStr | Transmission electron microscopy: physics of image formation and microanalysis |
title_full_unstemmed | Transmission electron microscopy: physics of image formation and microanalysis |
title_short | Transmission electron microscopy: physics of image formation and microanalysis |
title_sort | transmission electron microscopy: physics of image formation and microanalysis |
topic | General Theoretical Physics |
url | https://dx.doi.org/10.1007/978-3-662-21579-1 http://cds.cern.ch/record/1663792 |
work_keys_str_mv | AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis |