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Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module

Detalles Bibliográficos
Autor principal: Eklund, L
Lenguaje:eng
Publicado: 2009
Materias:
Acceso en línea:http://cds.cern.ch/record/1700092
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author Eklund, L
author_facet Eklund, L
author_sort Eklund, L
collection CERN
id cern-1700092
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2009
record_format invenio
spelling cern-17000922019-09-30T06:29:59Zhttp://cds.cern.ch/record/1700092engEklund, LBeam incidents - High particle rate tests of an LHCb/Velo silicon strip moduleTalkLHCb-TALK-2009-115oai:cds.cern.ch:17000922009
spellingShingle Talk
Eklund, L
Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title_full Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title_fullStr Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title_full_unstemmed Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title_short Beam incidents - High particle rate tests of an LHCb/Velo silicon strip module
title_sort beam incidents - high particle rate tests of an lhcb/velo silicon strip module
topic Talk
url http://cds.cern.ch/record/1700092
work_keys_str_mv AT eklundl beamincidentshighparticleratetestsofanlhcbvelosiliconstripmodule