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Radiation effects and soft errors in integrated circuits and electronic devices
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
World Scientific
2004
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| Acceso en línea: | http://cds.cern.ch/record/1701628 |