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Advanced field-solver techniques for RC extraction of integrated circuits

Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly import...

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Detalles Bibliográficos
Autores principales: Yu, Wenjian, Wang, Xiren
Lenguaje:eng
Publicado: Springer 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-54298-5
http://cds.cern.ch/record/1702351
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author Yu, Wenjian
Wang, Xiren
author_facet Yu, Wenjian
Wang, Xiren
author_sort Yu, Wenjian
collection CERN
description Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.
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spelling cern-17023512021-04-21T21:01:36Zdoi:10.1007/978-3-642-54298-5http://cds.cern.ch/record/1702351engYu, WenjianWang, XirenAdvanced field-solver techniques for RC extraction of integrated circuitsEngineeringResistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.Springeroai:cds.cern.ch:17023512014
spellingShingle Engineering
Yu, Wenjian
Wang, Xiren
Advanced field-solver techniques for RC extraction of integrated circuits
title Advanced field-solver techniques for RC extraction of integrated circuits
title_full Advanced field-solver techniques for RC extraction of integrated circuits
title_fullStr Advanced field-solver techniques for RC extraction of integrated circuits
title_full_unstemmed Advanced field-solver techniques for RC extraction of integrated circuits
title_short Advanced field-solver techniques for RC extraction of integrated circuits
title_sort advanced field-solver techniques for rc extraction of integrated circuits
topic Engineering
url https://dx.doi.org/10.1007/978-3-642-54298-5
http://cds.cern.ch/record/1702351
work_keys_str_mv AT yuwenjian advancedfieldsolvertechniquesforrcextractionofintegratedcircuits
AT wangxiren advancedfieldsolvertechniquesforrcextractionofintegratedcircuits