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Electromigration in thin films and electronic devices: materials and reliability
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Woodhead Publ.
2011
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1704864 |
| _version_ | 1780936448012189696 |
|---|---|
| author | Kim, Choong-Un |
| author_facet | Kim, Choong-Un |
| author_sort | Kim, Choong-Un |
| collection | CERN |
| id | cern-1704864 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2011 |
| publisher | Woodhead Publ. |
| record_format | invenio |
| spelling | cern-17048642021-04-21T20:59:46Zhttp://cds.cern.ch/record/1704864engKim, Choong-UnElectromigration in thin films and electronic devices: materials and reliabilityEngineeringWoodhead Publ.oai:cds.cern.ch:17048642011 |
| spellingShingle | Engineering Kim, Choong-Un Electromigration in thin films and electronic devices: materials and reliability |
| title | Electromigration in thin films and electronic devices: materials and reliability |
| title_full | Electromigration in thin films and electronic devices: materials and reliability |
| title_fullStr | Electromigration in thin films and electronic devices: materials and reliability |
| title_full_unstemmed | Electromigration in thin films and electronic devices: materials and reliability |
| title_short | Electromigration in thin films and electronic devices: materials and reliability |
| title_sort | electromigration in thin films and electronic devices: materials and reliability |
| topic | Engineering |
| url | http://cds.cern.ch/record/1704864 |
| work_keys_str_mv | AT kimchoongun electromigrationinthinfilmsandelectronicdevicesmaterialsandreliability |