Iris analysis for biometric recognition systems

The book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides d...

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Detalles Bibliográficos
Autores principales: Bodade, Rajesh M, Talbar, Sanjay N
Lenguaje:eng
Publicado: Springer 2014
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1007/978-81-322-1853-1
http://cds.cern.ch/record/1707495
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author Bodade, Rajesh M
Talbar, Sanjay N
author_facet Bodade, Rajesh M
Talbar, Sanjay N
author_sort Bodade, Rajesh M
collection CERN
description The book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides detailed analysis of iris images and two methods of iris segmentation. It also discusses simplified study of some subspace-based methods and distance measures for iris recognition backed by empirical studies and statistical success verifications.
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publishDate 2014
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spelling cern-17074952021-04-21T20:58:45Zdoi:10.1007/978-81-322-1853-1http://cds.cern.ch/record/1707495engBodade, Rajesh MTalbar, Sanjay NIris analysis for biometric recognition systemsEngineeringThe book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides detailed analysis of iris images and two methods of iris segmentation. It also discusses simplified study of some subspace-based methods and distance measures for iris recognition backed by empirical studies and statistical success verifications.Springeroai:cds.cern.ch:17074952014
spellingShingle Engineering
Bodade, Rajesh M
Talbar, Sanjay N
Iris analysis for biometric recognition systems
title Iris analysis for biometric recognition systems
title_full Iris analysis for biometric recognition systems
title_fullStr Iris analysis for biometric recognition systems
title_full_unstemmed Iris analysis for biometric recognition systems
title_short Iris analysis for biometric recognition systems
title_sort iris analysis for biometric recognition systems
topic Engineering
url https://dx.doi.org/10.1007/978-81-322-1853-1
http://cds.cern.ch/record/1707495
work_keys_str_mv AT bodaderajeshm irisanalysisforbiometricrecognitionsystems
AT talbarsanjayn irisanalysisforbiometricrecognitionsystems

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