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New Testing Methodology of an Analog to Digital Converter for the LHC Mixed Radiation Field
In this work a commercial off the shelf Analog to Digital Converter (ADC), based on a Successive Approximation Register (SAR) structure, has been tested to verify Total Ionizing Dose (TID) effects and evaluate Single Event Upset (SEU) and Single Event Latch-up (SEL) cross sections. A well-known test...
| Autores principales: | , , , |
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| Publicado: |
2013
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2013.2261825 http://cds.cern.ch/record/1709892 |