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An Analysis of the Radiation Damage to the ATLAS Semiconductor Tracker End-Caps
The motivation, theoretical principles and analytical procedure for an assessment of the radiation damage to the ATLAS SCT end-caps is presented. An analysis of the leakage current across end-cap modules is performed for 2011 and 2012 data. A comparison between the observed and expected leakage curr...
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Lenguaje: | eng |
Publicado: |
2014
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1742355 |
Sumario: | The motivation, theoretical principles and analytical procedure for an assessment of the radiation damage to the ATLAS SCT end-caps is presented. An analysis of the leakage current across end-cap modules is performed for 2011 and 2012 data. A comparison between the observed and expected leakage current is made, with measurements favouring the shape of the theoretical evolution. Measured data is found to be systematically lower than predicted for a large subset of end-cap modules, while the remainder show surface current effects which interfere with bulk current observation. Uniform differences for modules at different radial distances suggest a radial temperature distribution in the end-caps, with absolute silicon sensor temperature to be established in further analysis. |
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