Secondary emission monitor for keV ion and antiproton beams

Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Sec- ondary electron Emission Monitor (SEM) has been de- signed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.