Secondary emission monitor for keV ion and antiproton beams

Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Sec- ondary electron Emission Monitor (SEM) has been de- signed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel...

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Detalles Bibliográficos
Autores principales: Sosa, Alejandro, Jeff, Adam, Bravin, Enrico, Harasimowciz, Janusz, Welsch, C P
Lenguaje:eng
Publicado: 2013
Materias:
Accelerators and Storage Rings
Acceso en línea:http://cds.cern.ch/record/1743071
_version_ 1780942770022645760
author Sosa, Alejandro
Jeff, Adam
Bravin, Enrico
Harasimowciz, Janusz
Welsch, C P
author_facet Sosa, Alejandro
Jeff, Adam
Bravin, Enrico
Harasimowciz, Janusz
Welsch, C P
author_sort Sosa, Alejandro
collection CERN
description Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Sec- ondary electron Emission Monitor (SEM) has been de- signed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
id cern-1743071
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
record_format invenio
spelling cern-17430712022-08-17T13:32:00Zhttp://cds.cern.ch/record/1743071engSosa, AlejandroJeff, AdamBravin, EnricoHarasimowciz, JanuszWelsch, C PSecondary emission monitor for keV ion and antiproton beamsAccelerators and Storage RingsBeam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Sec- ondary electron Emission Monitor (SEM) has been de- signed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.oai:cds.cern.ch:17430712013
spellingShingle Accelerators and Storage Rings
Sosa, Alejandro
Jeff, Adam
Bravin, Enrico
Harasimowciz, Janusz
Welsch, C P
Secondary emission monitor for keV ion and antiproton beams
title Secondary emission monitor for keV ion and antiproton beams
title_full Secondary emission monitor for keV ion and antiproton beams
title_fullStr Secondary emission monitor for keV ion and antiproton beams
title_full_unstemmed Secondary emission monitor for keV ion and antiproton beams
title_short Secondary emission monitor for keV ion and antiproton beams
title_sort secondary emission monitor for kev ion and antiproton beams
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/1743071
work_keys_str_mv AT sosaalejandro secondaryemissionmonitorforkevionandantiprotonbeams
AT jeffadam secondaryemissionmonitorforkevionandantiprotonbeams
AT bravinenrico secondaryemissionmonitorforkevionandantiprotonbeams
AT harasimowcizjanusz secondaryemissionmonitorforkevionandantiprotonbeams
AT welschcp secondaryemissionmonitorforkevionandantiprotonbeams

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