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Secondary emission monitor for keV ion and antiproton beams
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Sec- ondary electron Emission Monitor (SEM) has been de- signed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2013
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1743071 |