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Advanced Readout Controller for PCI-based test systems of LHCb

Detalles Bibliográficos
Autor principal: Guirao et al, A
Lenguaje:eng
Publicado: 2003
Materias:
Acceso en línea:http://cds.cern.ch/record/1743074
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author Guirao et al, A
author_facet Guirao et al, A
author_sort Guirao et al, A
collection CERN
id cern-1743074
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
record_format invenio
spelling cern-17430742019-09-30T06:29:59Zhttp://cds.cern.ch/record/1743074engGuirao et al, AAdvanced Readout Controller for PCI-based test systems of LHCbTalkLHCb-TALK-2003-042oai:cds.cern.ch:17430742003
spellingShingle Talk
Guirao et al, A
Advanced Readout Controller for PCI-based test systems of LHCb
title Advanced Readout Controller for PCI-based test systems of LHCb
title_full Advanced Readout Controller for PCI-based test systems of LHCb
title_fullStr Advanced Readout Controller for PCI-based test systems of LHCb
title_full_unstemmed Advanced Readout Controller for PCI-based test systems of LHCb
title_short Advanced Readout Controller for PCI-based test systems of LHCb
title_sort advanced readout controller for pci-based test systems of lhcb
topic Talk
url http://cds.cern.ch/record/1743074
work_keys_str_mv AT guiraoetala advancedreadoutcontrollerforpcibasedtestsystemsoflhcb