Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam

This report will present results from the analysis of bias voltage scans in Timepix1 testbeam data. Three assemblies of varying sensor thickness were used to collect data. The effect of the bias voltage on charge sharing, in particular cluster size, was investigated and found to have a significant impact. The effect of the bias voltage on energy collection was also studied, leading to estimates for the depletion voltage, donor concentration, mobility and resistivity of each assembly. Finally, the effect of the bias voltage on the two-hit cluster resolution and detection efficiency was investigated. This report contains extracts from a longer document (LCD-OPEN-2014-001).