Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam

This report will present results from the analysis of bias voltage scans in Timepix1 testbeam data. Three assemblies of varying sensor thickness were used to collect data. The effect of the bias voltage on charge sharing, in particular cluster size, was investigated and found to have a significant i...

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Detalles Bibliográficos
Autor principal: Maimon, Shir
Lenguaje:eng
Publicado: 2014
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/1755801
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author Maimon, Shir
author_facet Maimon, Shir
author_sort Maimon, Shir
collection CERN
description This report will present results from the analysis of bias voltage scans in Timepix1 testbeam data. Three assemblies of varying sensor thickness were used to collect data. The effect of the bias voltage on charge sharing, in particular cluster size, was investigated and found to have a significant impact. The effect of the bias voltage on energy collection was also studied, leading to estimates for the depletion voltage, donor concentration, mobility and resistivity of each assembly. Finally, the effect of the bias voltage on the two-hit cluster resolution and detection efficiency was investigated. This report contains extracts from a longer document (LCD-OPEN-2014-001).
id cern-1755801
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
record_format invenio
spelling cern-17558012019-09-30T06:29:59Zhttp://cds.cern.ch/record/1755801engMaimon, ShirAnalysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeamDetectors and Experimental TechniquesThis report will present results from the analysis of bias voltage scans in Timepix1 testbeam data. Three assemblies of varying sensor thickness were used to collect data. The effect of the bias voltage on charge sharing, in particular cluster size, was investigated and found to have a significant impact. The effect of the bias voltage on energy collection was also studied, leading to estimates for the depletion voltage, donor concentration, mobility and resistivity of each assembly. Finally, the effect of the bias voltage on the two-hit cluster resolution and detection efficiency was investigated. This report contains extracts from a longer document (LCD-OPEN-2014-001).CERN-STUDENTS-Note-2014-199oai:cds.cern.ch:17558012014-09-16
spellingShingle Detectors and Experimental Techniques
Maimon, Shir
Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title_full Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title_fullStr Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title_full_unstemmed Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title_short Analysis of bias voltage scan data recorded with hybrid Timepix1 silicon pixel assemblies at the DESY testbeam
title_sort analysis of bias voltage scan data recorded with hybrid timepix1 silicon pixel assemblies at the desy testbeam
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1755801
work_keys_str_mv AT maimonshir analysisofbiasvoltagescandatarecordedwithhybridtimepix1siliconpixelassembliesatthedesytestbeam

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