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Applications of Mössbauer spectroscopy to investigations of defects in semiconductors
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
1988
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/192074 |
| _version_ | 1780881827925327872 |
|---|---|
| author | Nylandsted-Larsen, A Petersen, J W Weyer, G |
| author_facet | Nylandsted-Larsen, A Petersen, J W Weyer, G |
| author_sort | Nylandsted-Larsen, A |
| collection | CERN |
| id | cern-192074 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1988 |
| record_format | invenio |
| spelling | cern-1920742019-09-30T06:29:59Zhttp://cds.cern.ch/record/192074engNylandsted-Larsen, APetersen, J WWeyer, GApplications of Mössbauer spectroscopy to investigations of defects in semiconductorsOther Fields of PhysicsCERN-EP-88-149oai:cds.cern.ch:1920741988-10-26 |
| spellingShingle | Other Fields of Physics Nylandsted-Larsen, A Petersen, J W Weyer, G Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title | Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title_full | Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title_fullStr | Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title_full_unstemmed | Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title_short | Applications of Mössbauer spectroscopy to investigations of defects in semiconductors |
| title_sort | applications of mössbauer spectroscopy to investigations of defects in semiconductors |
| topic | Other Fields of Physics |
| url | http://cds.cern.ch/record/192074 |
| work_keys_str_mv | AT nylandstedlarsena applicationsofmossbauerspectroscopytoinvestigationsofdefectsinsemiconductors AT petersenjw applicationsofmossbauerspectroscopytoinvestigationsofdefectsinsemiconductors AT weyerg applicationsofmossbauerspectroscopytoinvestigationsofdefectsinsemiconductors |