Cargando…

Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment

This paper describes radiation studies of a SRAM-based FPGAas a central component for a upgrade of the LHCb Outer Trackerfront-end electronics to a readout frequency of 40 MHz. Two ArriaGX FPGAs were irradiated with 20 MeV protons to radiation doses ofup to 7 Mrad. During and between the irradiation...

Descripción completa

Detalles Bibliográficos
Autores principales: Färber, C, Uwer, U, Wiedner, D., Leverington, B., Ekelhof, R.
Lenguaje:eng
Publicado: 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/9/02/C02028
http://cds.cern.ch/record/1951840
_version_ 1780944261409144832
author Färber, C
Uwer, U
Wiedner, D.
Leverington, B.
Ekelhof, R.
author_facet Färber, C
Uwer, U
Wiedner, D.
Leverington, B.
Ekelhof, R.
author_sort Färber, C
collection CERN
description This paper describes radiation studies of a SRAM-based FPGAas a central component for a upgrade of the LHCb Outer Trackerfront-end electronics to a readout frequency of 40 MHz. Two ArriaGX FPGAs were irradiated with 20 MeV protons to radiation doses ofup to 7 Mrad. During and between the irradiation periods thedifferent FPGA currents, the package temperature, the firmware errorrate, the PLL stability, and the stability of a 32 channel TDCimplemented on the FPGA were monitored. Results on the radiationtolerance of the FPGA and the measured firmware error rates will bepresented. The Arria GX FPGA fulfills the radiation tolerancerequired for the LHCb upgrade (30 krad) and an expected firmwareerror rate of roughly 10−6 Hz makes the chip a possiblecomponent for the upgraded front-end electronics.
id cern-1951840
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
record_format invenio
spelling cern-19518402019-09-30T06:29:59Zdoi:10.1088/1748-0221/9/02/C02028http://cds.cern.ch/record/1951840engFärber, CUwer, UWiedner, D.Leverington, B.Ekelhof, R.Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experimentDetectors and Experimental TechniquesThis paper describes radiation studies of a SRAM-based FPGAas a central component for a upgrade of the LHCb Outer Trackerfront-end electronics to a readout frequency of 40 MHz. Two ArriaGX FPGAs were irradiated with 20 MeV protons to radiation doses ofup to 7 Mrad. During and between the irradiation periods thedifferent FPGA currents, the package temperature, the firmware errorrate, the PLL stability, and the stability of a 32 channel TDCimplemented on the FPGA were monitored. Results on the radiationtolerance of the FPGA and the measured firmware error rates will bepresented. The Arria GX FPGA fulfills the radiation tolerancerequired for the LHCb upgrade (30 krad) and an expected firmwareerror rate of roughly 10−6 Hz makes the chip a possiblecomponent for the upgraded front-end electronics.oai:cds.cern.ch:19518402014
spellingShingle Detectors and Experimental Techniques
Färber, C
Uwer, U
Wiedner, D.
Leverington, B.
Ekelhof, R.
Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title_full Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title_fullStr Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title_full_unstemmed Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title_short Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
title_sort radiation tolerance tests of sram-based fpgas for the potential usage in the readout electronics for the lhcb experiment
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/9/02/C02028
http://cds.cern.ch/record/1951840
work_keys_str_mv AT farberc radiationtolerancetestsofsrambasedfpgasforthepotentialusageinthereadoutelectronicsforthelhcbexperiment
AT uweru radiationtolerancetestsofsrambasedfpgasforthepotentialusageinthereadoutelectronicsforthelhcbexperiment
AT wiednerd radiationtolerancetestsofsrambasedfpgasforthepotentialusageinthereadoutelectronicsforthelhcbexperiment
AT leveringtonb radiationtolerancetestsofsrambasedfpgasforthepotentialusageinthereadoutelectronicsforthelhcbexperiment
AT ekelhofr radiationtolerancetestsofsrambasedfpgasforthepotentialusageinthereadoutelectronicsforthelhcbexperiment