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Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors

Detalles Bibliográficos
Autores principales: Borchi, E, Bertrand, C, Leroy, C, Bruzzi, Mara, Furetta, C, Paludetto, R, Rancoita, P G, Vismara, L, Giubellino, P
Lenguaje:eng
Publicado: 1989
Materias:
Acceso en línea:https://dx.doi.org/10.1016/0168-9002(89)91093-0
http://cds.cern.ch/record/195215
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author Borchi, E
Bertrand, C
Leroy, C
Bruzzi, Mara
Furetta, C
Paludetto, R
Rancoita, P G
Vismara, L
Giubellino, P
author_facet Borchi, E
Bertrand, C
Leroy, C
Bruzzi, Mara
Furetta, C
Paludetto, R
Rancoita, P G
Vismara, L
Giubellino, P
author_sort Borchi, E
collection CERN
id cern-195215
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1989
record_format invenio
spelling cern-1952152019-09-30T06:29:59Zdoi:10.1016/0168-9002(89)91093-0http://cds.cern.ch/record/195215engBorchi, EBertrand, CLeroy, CBruzzi, MaraFuretta, CPaludetto, RRancoita, P GVismara, LGiubellino, PDeep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectorsDetectors and Experimental TechniquesCERN-EP-89-26oai:cds.cern.ch:1952151989-02-09
spellingShingle Detectors and Experimental Techniques
Borchi, E
Bertrand, C
Leroy, C
Bruzzi, Mara
Furetta, C
Paludetto, R
Rancoita, P G
Vismara, L
Giubellino, P
Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title_full Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title_fullStr Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title_full_unstemmed Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title_short Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
title_sort deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/0168-9002(89)91093-0
http://cds.cern.ch/record/195215
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