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Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors
Autores principales: | Borchi, E, Bertrand, C, Leroy, C, Bruzzi, Mara, Furetta, C, Paludetto, R, Rancoita, P G, Vismara, L, Giubellino, P |
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Lenguaje: | eng |
Publicado: |
1989
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/0168-9002(89)91093-0 http://cds.cern.ch/record/195215 |
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