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Thoughtful machine learning : a test-driven approach
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
O'Reilly Media
2015
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1970092 |
| _version_ | 1780944773484380160 |
|---|---|
| author | Kirk, Matthew |
| author_facet | Kirk, Matthew |
| author_sort | Kirk, Matthew |
| collection | CERN |
| id | cern-1970092 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2015 |
| publisher | O'Reilly Media |
| record_format | invenio |
| spelling | cern-19700922021-04-21T20:48:51Zhttp://cds.cern.ch/record/1970092engKirk, Matthew Thoughtful machine learning : a test-driven approach Computing and ComputersO'Reilly Mediaoai:cds.cern.ch:19700922015 |
| spellingShingle | Computing and Computers Kirk, Matthew Thoughtful machine learning : a test-driven approach |
| title |
Thoughtful machine learning
:
a test-driven approach
|
| title_full |
Thoughtful machine learning
:
a test-driven approach
|
| title_fullStr |
Thoughtful machine learning
:
a test-driven approach
|
| title_full_unstemmed |
Thoughtful machine learning
:
a test-driven approach
|
| title_short |
Thoughtful machine learning
:
a test-driven approach
|
| title_sort | thoughtful machine learning
:
a test-driven approach |
| topic | Computing and Computers |
| url | http://cds.cern.ch/record/1970092 |
| work_keys_str_mv | AT kirkmatthew thoughtfulmachinelearningatestdrivenapproach |