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Analytical techniques for thin films: treatise on materials science and technology
Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron be...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Academic Press
1988
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| Acceso en línea: | http://cds.cern.ch/record/1975239 |