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Reliability and failure of electronic materials and devices
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Elsevier
2014
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1977319 |
| _version_ | 1780945160469741568 |
|---|---|
| author | Ohring, Milton Kasprzak, Lucian |
| author_facet | Ohring, Milton Kasprzak, Lucian |
| author_sort | Ohring, Milton |
| collection | CERN |
| id | cern-1977319 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2014 |
| publisher | Elsevier |
| record_format | invenio |
| spelling | cern-19773192021-04-21T20:39:21Zhttp://cds.cern.ch/record/1977319engOhring, MiltonKasprzak, LucianReliability and failure of electronic materials and devicesComputing and ComputersElsevieroai:cds.cern.ch:19773192014 |
| spellingShingle | Computing and Computers Ohring, Milton Kasprzak, Lucian Reliability and failure of electronic materials and devices |
| title | Reliability and failure of electronic materials and devices |
| title_full | Reliability and failure of electronic materials and devices |
| title_fullStr | Reliability and failure of electronic materials and devices |
| title_full_unstemmed | Reliability and failure of electronic materials and devices |
| title_short | Reliability and failure of electronic materials and devices |
| title_sort | reliability and failure of electronic materials and devices |
| topic | Computing and Computers |
| url | http://cds.cern.ch/record/1977319 |
| work_keys_str_mv | AT ohringmilton reliabilityandfailureofelectronicmaterialsanddevices AT kasprzaklucian reliabilityandfailureofelectronicmaterialsanddevices |