COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches

This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platf...

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Detalles Bibliográficos
Autores principales: Slawosz, Uznanski, Benjamin, Todd, Johannes, Walter, Andrea, Vilar-Villanueva
Lenguaje:eng
Publicado: 2015
Materias:
Nuclear Physics - Experiment
Acceso en línea:http://cds.cern.ch/record/1979601
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author Slawosz, Uznanski
Benjamin, Todd
Johannes, Walter
Andrea, Vilar-Villanueva
author_facet Slawosz, Uznanski
Benjamin, Todd
Johannes, Walter
Andrea, Vilar-Villanueva
author_sort Slawosz, Uznanski
collection CERN
description This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platform are presented for 150nm TFT SRAM (Renesas) and different sizes of the 130nm ProASIC3 FPGA (Microsemi).
id cern-1979601
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling cern-19796012019-09-30T06:29:59Zhttp://cds.cern.ch/record/1979601engSlawosz, UznanskiBenjamin, ToddJohannes, WalterAndrea, Vilar-VillanuevaCOTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component BatchesNuclear Physics - ExperimentThis paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platform are presented for 150nm TFT SRAM (Renesas) and different sizes of the 130nm ProASIC3 FPGA (Microsemi).CERN-ACC-2015-0001oai:cds.cern.ch:19796012015-01-05
spellingShingle Nuclear Physics - Experiment
Slawosz, Uznanski
Benjamin, Todd
Johannes, Walter
Andrea, Vilar-Villanueva
COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title_full COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title_fullStr COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title_full_unstemmed COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title_short COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches
title_sort cots fpga/sram irradiations using a dedicated testing infrastructure for characterization of large component batches
topic Nuclear Physics - Experiment
url http://cds.cern.ch/record/1979601
work_keys_str_mv AT slawoszuznanski cotsfpgasramirradiationsusingadedicatedtestinginfrastructureforcharacterizationoflargecomponentbatches
AT benjamintodd cotsfpgasramirradiationsusingadedicatedtestinginfrastructureforcharacterizationoflargecomponentbatches
AT johanneswalter cotsfpgasramirradiationsusingadedicatedtestinginfrastructureforcharacterizationoflargecomponentbatches
AT andreavilarvillanueva cotsfpgasramirradiationsusingadedicatedtestinginfrastructureforcharacterizationoflargecomponentbatches

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