COTS FPGA/SRAM Irradiations Using a Dedicated Testing Infrastructure for Characterization of Large Component Batches

This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platf...

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Detalles Bibliográficos
Autores principales: Slawosz, Uznanski, Benjamin, Todd, Johannes, Walter, Andrea, Vilar-Villanueva
Lenguaje:eng
Publicado: 2015
Materias:
Nuclear Physics - Experiment
Acceso en línea:http://cds.cern.ch/record/1979601

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