Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were...

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Detalles Bibliográficos
Autores principales: Dragicevic, M, Auzinger, G, Bartl, U, Bergauer, T, Gamerith, S, Hacker, J, König, A, Kröner, F, Kucher, E, Moser, J, Neidhart, T, Schulze, H-J, Schustereder, W, Treberspurg, W, Wübben, T
Lenguaje:eng
Publicado: 2014
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2014.04.043
http://cds.cern.ch/record/1981989
Descripción
Sumario:Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European-based semiconductor manufacturer Infineon Technologies AG (Infineon) the Institute of High Energy Physics of the Austrian Academy of Sciences (HEPHY) developed planar silicon strip sensors in p-on-n technology. This work presents the first results from a beam test of strip sensors manufactured by Infineon.

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