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Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG
Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were...
| Autores principales: | , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2014
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2014.04.043 http://cds.cern.ch/record/1981989 |
| _version_ | 1780945311062032384 |
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| author | Dragicevic, M Auzinger, G Bartl, U Bergauer, T Gamerith, S Hacker, J König, A Kröner, F Kucher, E Moser, J Neidhart, T Schulze, H-J Schustereder, W Treberspurg, W Wübben, T |
| author_facet | Dragicevic, M Auzinger, G Bartl, U Bergauer, T Gamerith, S Hacker, J König, A Kröner, F Kucher, E Moser, J Neidhart, T Schulze, H-J Schustereder, W Treberspurg, W Wübben, T |
| author_sort | Dragicevic, M |
| collection | CERN |
| description | Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European-based semiconductor manufacturer Infineon Technologies AG (Infineon) the Institute of High Energy Physics of the Austrian Academy of Sciences (HEPHY) developed planar silicon strip sensors in p-on-n technology. This work presents the first results from a beam test of strip sensors manufactured by Infineon. |
| id | cern-1981989 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2014 |
| record_format | invenio |
| spelling | cern-19819892022-08-10T20:36:10Zdoi:10.1016/j.nima.2014.04.043http://cds.cern.ch/record/1981989engDragicevic, MAuzinger, GBartl, UBergauer, TGamerith, SHacker, JKönig, AKröner, FKucher, EMoser, JNeidhart, TSchulze, H-JSchustereder, WTreberspurg, WWübben, TResults from a beam test of silicon strip sensors manufactured by Infineon Technologies AGXXMost modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European-based semiconductor manufacturer Infineon Technologies AG (Infineon) the Institute of High Energy Physics of the Austrian Academy of Sciences (HEPHY) developed planar silicon strip sensors in p-on-n technology. This work presents the first results from a beam test of strip sensors manufactured by Infineon.oai:cds.cern.ch:19819892014 |
| spellingShingle | XX Dragicevic, M Auzinger, G Bartl, U Bergauer, T Gamerith, S Hacker, J König, A Kröner, F Kucher, E Moser, J Neidhart, T Schulze, H-J Schustereder, W Treberspurg, W Wübben, T Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title | Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title_full | Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title_fullStr | Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title_full_unstemmed | Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title_short | Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG |
| title_sort | results from a beam test of silicon strip sensors manufactured by infineon technologies ag |
| topic | XX |
| url | https://dx.doi.org/10.1016/j.nima.2014.04.043 http://cds.cern.ch/record/1981989 |
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