Evaluation of KEK n-in-p planar pixel sensor structures for very high radiation environments with testbeam

Various structures for n-in-p planar pixel sensors have been developed at KEK in order to cope with the huge particle fluence in the upcoming LHC upgrades. Performances of the sensors with different structures have been evaluated with testbeam. The n-in-p devices were connected by bump-bonding to th...

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Detalles Bibliográficos
Autores principales: Motohashi, K, Kubota, T, Nakamura, K, Hori, R, Gallrapp, C, Unno, Y, Jinnouchi, O, Altenheiner, S, Arai, Y, Hagihara, M, Backhaus, M, Bomben, M, Forshaw, D, George, M, Hanagaki, K, Hara, K, Hirose, M, Ikegami, Y, Ishijima, N, Jentzsch, J, Kawagoe, K, Kimura, N, Kono, T, Macchiolo, A, Nishimura, R, Oda, S, Otono, H, Rubinskiy, I, Rummler, A, Takashima, R, Takubo, Y, Teoh, J J, Terada, S, Todome, K, Tojo, J, Usui, J, Weigell, P, Weingarten, J, Yamaguchi, D, Yorita, K
Lenguaje:eng
Publicado: 2014
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2014.05.092
http://cds.cern.ch/record/1982267

Internet

https://dx.doi.org/10.1016/j.nima.2014.05.092
http://cds.cern.ch/record/1982267

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