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Physical limitations to the spatial resolution of solid-state detectors

In this paper we explore the effect of -ray emission and fluctuations in the signal deposition on the detection of charged particles in silicon-based detectors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented posi...

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Detalles Bibliográficos
Autores principales: Boronat, M., Marinas, C., Frey, A., Garcia, I., Schwenker, B., Vos, M., Wilk, F.
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: IEEE Trans. Nucl. Sci. 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1109/TNS.2014.2376941
http://cds.cern.ch/record/2002654
Descripción
Sumario:In this paper we explore the effect of -ray emission and fluctuations in the signal deposition on the detection of charged particles in silicon-based detectors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented position-sensitive solid-state devices.