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12th International Symposium on Electron Beam Ion Sources and Traps and Their Applications
The EBIST symposia date back to 1977 and have taken place every 3 to 4 years to specifically discuss progress and exchange ideas in the design, development, applications of electron beam ion sources and traps, and the physics with highly charged ions. The topics to be covered in 2014 are: - Progress...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2014
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2002887 |