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On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devi...
Autores principales: | , , , , , |
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Lenguaje: | eng |
Publicado: |
Springer
2015
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-10819-3 http://cds.cern.ch/record/2005774 |
_version_ | 1780946216419328000 |
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author | Cui, Qiang Liou, Juin J Hajjar, Jean-Jacques Salcedo, Javier Zhou, Yuanzhong Srivatsan, Parthasarathy |
author_facet | Cui, Qiang Liou, Juin J Hajjar, Jean-Jacques Salcedo, Javier Zhou, Yuanzhong Srivatsan, Parthasarathy |
author_sort | Cui, Qiang |
collection | CERN |
description | This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance. |
id | cern-2005774 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2015 |
publisher | Springer |
record_format | invenio |
spelling | cern-20057742021-04-21T20:24:40Zdoi:10.1007/978-3-319-10819-3http://cds.cern.ch/record/2005774engCui, QiangLiou, Juin JHajjar, Jean-JacquesSalcedo, JavierZhou, YuanzhongSrivatsan, ParthasarathyOn-chip electro-static discharge (ESD) protection for radio-frequency integrated circuitsEngineeringThis book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.Springeroai:cds.cern.ch:20057742015 |
spellingShingle | Engineering Cui, Qiang Liou, Juin J Hajjar, Jean-Jacques Salcedo, Javier Zhou, Yuanzhong Srivatsan, Parthasarathy On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title | On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title_full | On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title_fullStr | On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title_full_unstemmed | On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title_short | On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits |
title_sort | on-chip electro-static discharge (esd) protection for radio-frequency integrated circuits |
topic | Engineering |
url | https://dx.doi.org/10.1007/978-3-319-10819-3 http://cds.cern.ch/record/2005774 |
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