Cargando…
Advanced computing in electron microscopy
pending
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
1998
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4757-4406-4 http://cds.cern.ch/record/2006442 |
| _version_ | 1780946318805434368 |
|---|---|
| author | Kirkland, Earl J |
| author_facet | Kirkland, Earl J |
| author_sort | Kirkland, Earl J |
| collection | CERN |
| description | pending |
| id | cern-2006442 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1998 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-20064422021-04-21T20:22:31Zdoi:10.1007/978-1-4757-4406-4http://cds.cern.ch/record/2006442engKirkland, Earl JAdvanced computing in electron microscopyOther Fields of PhysicspendingSpringeroai:cds.cern.ch:20064421998 |
| spellingShingle | Other Fields of Physics Kirkland, Earl J Advanced computing in electron microscopy |
| title | Advanced computing in electron microscopy |
| title_full | Advanced computing in electron microscopy |
| title_fullStr | Advanced computing in electron microscopy |
| title_full_unstemmed | Advanced computing in electron microscopy |
| title_short | Advanced computing in electron microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Other Fields of Physics |
| url | https://dx.doi.org/10.1007/978-1-4757-4406-4 http://cds.cern.ch/record/2006442 |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |