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Advanced computing in electron microscopy

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Detalles Bibliográficos
Autor principal:	Kirkland, Earl J
Lenguaje:	eng
Publicado:	Springer 1998
Materias:	Other Fields of Physics
Acceso en línea:	https://dx.doi.org/10.1007/978-1-4757-4406-4 http://cds.cern.ch/record/2006442

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