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Scanning tunneling microscopy II: further applications and related scanning techniques

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry...

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Detalles Bibliográficos
Autores principales: Wiesendanger, Roland, Güntherodt, Hans-Joachim
Lenguaje:eng
Publicado: Springer 1995
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-79366-0
http://cds.cern.ch/record/2006467
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author Wiesendanger, Roland
Güntherodt, Hans-Joachim
author_facet Wiesendanger, Roland
Güntherodt, Hans-Joachim
author_sort Wiesendanger, Roland
collection CERN
description Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.
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spelling cern-20064672021-04-21T20:22:22Zdoi:10.1007/978-3-642-79366-0http://cds.cern.ch/record/2006467engWiesendanger, RolandGüntherodt, Hans-JoachimScanning tunneling microscopy II: further applications and related scanning techniquesOther Fields of PhysicsScanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.Springeroai:cds.cern.ch:20064671995
spellingShingle Other Fields of Physics
Wiesendanger, Roland
Güntherodt, Hans-Joachim
Scanning tunneling microscopy II: further applications and related scanning techniques
title Scanning tunneling microscopy II: further applications and related scanning techniques
title_full Scanning tunneling microscopy II: further applications and related scanning techniques
title_fullStr Scanning tunneling microscopy II: further applications and related scanning techniques
title_full_unstemmed Scanning tunneling microscopy II: further applications and related scanning techniques
title_short Scanning tunneling microscopy II: further applications and related scanning techniques
title_sort scanning tunneling microscopy ii: further applications and related scanning techniques
topic Other Fields of Physics
url https://dx.doi.org/10.1007/978-3-642-79366-0
http://cds.cern.ch/record/2006467
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