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Transmission electron microscopy and diffractometry of materials
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif-...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2001
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-662-04516-9 http://cds.cern.ch/record/2006489 |
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