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Secondary particle acquisition system for the CERN beam wire scanners upgrade
The increasing requirements of CERN experiments make essential the upgrade of beam instrumentation in general, and high accuracy beam profile monitors in particular. The CERN Beam Instrumentation Group has been working during the last years on the Wire Scanners upgrade. These systems cross a thin wi...
Autores principales: | Sirvent, J L, Dehning, B, Emery, J, Diéguez, A |
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Lenguaje: | eng |
Publicado: |
2015
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/10/04/C04021 http://cds.cern.ch/record/2011611 |
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