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Scanning electron microscopy: physics of image formation and microanalysis
The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of t...
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| Lenguaje: | eng |
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Springer
1985
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-662-13562-4 http://cds.cern.ch/record/2023482 |
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