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EMI-resilient amplifier circuits

This book enables circuit designers to reduce the errors introduced by the fundamental limitations and electromagnetic interference (EMI) in negative-feedback amplifiers.  The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-t...

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Detalles Bibliográficos
Autores principales: van der Horst, Marcel J, Serdijn, Wouter A, Linnenbank, André C
Lenguaje:eng
Publicado: Springer 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-00593-5
http://cds.cern.ch/record/2023580
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author van der Horst, Marcel J
Serdijn, Wouter A
Linnenbank, André C
author_facet van der Horst, Marcel J
Serdijn, Wouter A
Linnenbank, André C
author_sort van der Horst, Marcel J
collection CERN
description This book enables circuit designers to reduce the errors introduced by the fundamental limitations and electromagnetic interference (EMI) in negative-feedback amplifiers.  The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER).  This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in  application specific amplifiers in order to meet the SER requirements.   ·         Describes design methods that incorporate electromagnetic interference (EMI) in the design of application specific negative-feedback amplifiers; ·         Provides designers with a structured methodology to avoid the use of trial and error in meeting signal-to-error ratio (SER) requirements; ·         Equips designers to increase EMI immunity of the amplifier itself, thus avoiding filtering at the input, reducing the number of components and avoiding detrimental effects on noise and stability.  .
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
publisher Springer
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spelling cern-20235802021-04-21T20:12:37Zdoi:10.1007/978-3-319-00593-5http://cds.cern.ch/record/2023580engvan der Horst, Marcel JSerdijn, Wouter ALinnenbank, André CEMI-resilient amplifier circuitsEngineeringThis book enables circuit designers to reduce the errors introduced by the fundamental limitations and electromagnetic interference (EMI) in negative-feedback amplifiers.  The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER).  This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in  application specific amplifiers in order to meet the SER requirements.   ·         Describes design methods that incorporate electromagnetic interference (EMI) in the design of application specific negative-feedback amplifiers; ·         Provides designers with a structured methodology to avoid the use of trial and error in meeting signal-to-error ratio (SER) requirements; ·         Equips designers to increase EMI immunity of the amplifier itself, thus avoiding filtering at the input, reducing the number of components and avoiding detrimental effects on noise and stability.  .Springeroai:cds.cern.ch:20235802014
spellingShingle Engineering
van der Horst, Marcel J
Serdijn, Wouter A
Linnenbank, André C
EMI-resilient amplifier circuits
title EMI-resilient amplifier circuits
title_full EMI-resilient amplifier circuits
title_fullStr EMI-resilient amplifier circuits
title_full_unstemmed EMI-resilient amplifier circuits
title_short EMI-resilient amplifier circuits
title_sort emi-resilient amplifier circuits
topic Engineering
url https://dx.doi.org/10.1007/978-3-319-00593-5
http://cds.cern.ch/record/2023580
work_keys_str_mv AT vanderhorstmarcelj emiresilientamplifiercircuits
AT serdijnwoutera emiresilientamplifiercircuits
AT linnenbankandrec emiresilientamplifiercircuits