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Impact of low-dose electron irradiation on $n^+p$ silicon strip sensors

The response of $n^+p$ silicon strip sensors to electrons from a $^{90}$Sr source was measured using a multi-channel read-out system with 25\,ns sampling time. The measurements were performed over a period of several weeks, during which the operating conditions were varied. The sensors were fabrica...

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Detalles Bibliográficos
Autor principal: The CMS Tracker Collaboration
Lenguaje:eng
Publicado: 2014
Materias:
Acceso en línea:http://cds.cern.ch/record/2026427

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