Cargando…
Impact of low-dose electron irradiation on $n^+p$ silicon strip sensors
The response of $n^+p$ silicon strip sensors to electrons from a $^{90}$Sr source was measured using a multi-channel read-out system with 25\,ns sampling time. The measurements were performed over a period of several weeks, during which the operating conditions were varied. The sensors were fabrica...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2014
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2026427 |