Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis

One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltag...

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Detalles Bibliográficos
Autor principal: Gallay, R.
Lenguaje:eng
Publicado: 2016
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.5170/CERN-2015-003.45
http://cds.cern.ch/record/2038610
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author Gallay, R.
author_facet Gallay, R.
author_sort Gallay, R.
collection CERN
description One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltage, and the humidity. This paper discusses the different capacitor failure modes and their effects and consequences.
id cern-2038610
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
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spelling cern-20386102023-03-14T19:35:32Zdoi:10.5170/CERN-2015-003.45http://cds.cern.ch/record/2038610engGallay, R.Metallized Film Capacitor Lifetime Evaluation and Failure Mode AnalysisAccelerators and Storage RingsOne of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltage, and the humidity. This paper discusses the different capacitor failure modes and their effects and consequences.One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltage, and the humidity. This paper discusses the different capacitor failure modes and their effects and consequences.arXiv:1607.01540arXiv:1607.01540oai:cds.cern.ch:20386102016-07-06
spellingShingle Accelerators and Storage Rings
Gallay, R.
Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title_full Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title_fullStr Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title_full_unstemmed Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title_short Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
title_sort metallized film capacitor lifetime evaluation and failure mode analysis
topic Accelerators and Storage Rings
url https://dx.doi.org/10.5170/CERN-2015-003.45
http://cds.cern.ch/record/2038610
work_keys_str_mv AT gallayr metallizedfilmcapacitorlifetimeevaluationandfailuremodeanalysis

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