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Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltag...
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| Lenguaje: | eng |
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2016
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| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2015-003.45 http://cds.cern.ch/record/2038610 |