Modelling and integration of a time-resolved ion beam measurement system for laser ionized beams at ISOLDE

The purpose of this project was to simulate designs to determine the optimal ion optic configuration for the detection of secondary electrons using a MagneTOF detector. The secondary electrons are emitted from a target plate, made out of aluminum, when an ion beam hits the target plate. The electrons are then emitted according to a cosine distribution. The intention is to detect these electrons with a MagneTOF detector. Since the target plate and the detector were already mounted in a chamber the main tasks were to accelerate and focus the emitted electrons into the entrance of the detector. This was done by using an electrical grid and an Einzel lens. An already existing setup, created in Autodesk Inventor Professional, was used and modified. The setup was then imported into SIMION were the emission of electrons could be simulated. The desired percentage of detected electrons, i.e. the electrons which enter the MagneTOF detector with an energy greater than 1 keV, is in this case 10% or more. This was obtained for all simulations mentioned in this report, after the voltages, which were applied on the different components, had been optimized. The obtained percentages for these simulations are between 13% - 22% depending on which setup is used.