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Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips
An ALPIDE-1 monolithic silicon pixel sensor prototype has been laser soldered to a flex printed circuit using a novel interconnection technique using lasers. This technique is to be optimised to ensure stable, good quality connections between the sensor chips and the FPCs. To test the long-term...
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Lenguaje: | eng |
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2015
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Acceso en línea: | http://cds.cern.ch/record/2051926 |
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author | Strand, Frode Sneve |
author_facet | Strand, Frode Sneve |
author_sort | Strand, Frode Sneve |
collection | CERN |
description | An ALPIDE-1 monolithic silicon pixel sensor prototype has been laser soldered to a flex printed circuit using a novel interconnection technique using lasers. This technique is to be optimised to ensure stable, good quality connections between the sensor chips and the FPCs. To test the long-term stability of the connections, as well as study the effects on hit thresholds and noise in the sensor, it was thermally cycled in a climate chamber 1200 times. The soldered connections showed good qualities like even melting and good adhesion on pad/flex surfaces, and the chip remained in working condition for 1080 cycles. After this, a few connections failed, having cracks in the soldering tin, rendering the chip unusable. Threshold and noise characteristics seemed stable, except for the noise levels of sector 2 in the chip, for 1000 cycles in a temperature interval of "10^{\circ}" and "50^{\circ}" C. Still, further testing with wider temperature ranges and more cycles is needed to test the limitations of the chip. |
id | cern-2051926 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2015 |
record_format | invenio |
spelling | cern-20519262019-09-30T06:29:59Zhttp://cds.cern.ch/record/2051926engStrand, Frode SneveLaser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel ChipsDetectors and Experimental TechniquesAn ALPIDE-1 monolithic silicon pixel sensor prototype has been laser soldered to a flex printed circuit using a novel interconnection technique using lasers. This technique is to be optimised to ensure stable, good quality connections between the sensor chips and the FPCs. To test the long-term stability of the connections, as well as study the effects on hit thresholds and noise in the sensor, it was thermally cycled in a climate chamber 1200 times. The soldered connections showed good qualities like even melting and good adhesion on pad/flex surfaces, and the chip remained in working condition for 1080 cycles. After this, a few connections failed, having cracks in the soldering tin, rendering the chip unusable. Threshold and noise characteristics seemed stable, except for the noise levels of sector 2 in the chip, for 1000 cycles in a temperature interval of "10^{\circ}" and "50^{\circ}" C. Still, further testing with wider temperature ranges and more cycles is needed to test the limitations of the chip.CERN-STUDENTS-Note-2015-185oai:cds.cern.ch:20519262015-09-11 |
spellingShingle | Detectors and Experimental Techniques Strand, Frode Sneve Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title | Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title_full | Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title_fullStr | Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title_full_unstemmed | Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title_short | Laser Soldering and Thermal Cycling Tests of Monolithic Silicon Pixel Chips |
title_sort | laser soldering and thermal cycling tests of monolithic silicon pixel chips |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/2051926 |
work_keys_str_mv | AT strandfrodesneve lasersolderingandthermalcyclingtestsofmonolithicsiliconpixelchips |