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Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope
| Lenguaje: | fre eng |
|---|---|
| Publicado: |
2015
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| Acceso en línea: | http://cds.cern.ch/record/2054001 |
| _version_ | 1780948231780302848 |
|---|---|
| collection | CERN |
| id | cern-2054001 |
| institution | Organización Europea para la Investigación Nuclear |
| language | fre eng |
| publishDate | 2015 |
| record_format | invenio |
| spelling | cern-20540012019-09-30T06:29:59Zhttp://cds.cern.ch/record/2054001freengProposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope353rd Meeting of Finance CommitteeCERN/FC/5945/RAoai:cds.cern.ch:20540012015 |
| spellingShingle | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title_full | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title_fullStr | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title_full_unstemmed | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title_short | Proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| title_sort | proposal for the award of a contract for the supply, installation, commissioning and maintenance of a dual-beam focused ion beam and scanning electron microscope |
| url | http://cds.cern.ch/record/2054001 |