Extreme Value Statistical Characterization of Time Domain Pulse-to-Pulse Measurements

An analytical method, based on Extreme Value Theory (EV T), for predicting the worst case repeatability of time domain pulse-to-pulse measurements, modeled as independent and identically distributed random variables, is proposed. The method allows the use of the noise level of a measurement system for predicting the upcoming peak values over a given number of independent observations. The proposed analytical model is compared against simulated distributions generated in Matlab, highlighting satisfying match for any sample size.The simulations are based on a case study on the characterization of a pulsed power supply for the klystron modulators of the Compact LInear Collider (CLIC) under study at CERN.